This Stress, Strain And Failure eBook from 3D-LABS is written for engineers and students who want a clear, practical reference they can apply immediately.
Stress, Strain and Failure — A Working Engineer covers mechanics of materials from stress and strain fundamentals through failure theories, fatigue, creep, fracture mechanics, and combined loading — with worked examples from pressure vessel, shaft, and structural steel engineering practice.
What standards does this book reference?
ASME VIII Div 2 Part 5 (failure criteria for pressure vessels by design-by-analysis), IS 800:2007 (structural steel design by limit state method), AISC 360-22 (structural steel in North American practice), and ASTM E399 (plane-strain fracture toughness KIc measurement and test procedure).
What failure theories are covered for ductile and brittle materials?
Ductile: (1) Maximum Shear Stress (Tresca) criterion: tau-max = (sigma1 – sigma3)/2 <= Sy/2 — conservative; (2) Distortion Energy (von Mises) criterion: sigma-eq = sqrt[(sigma1-sigma2)^2 + (sigma2-sigma3)^2 + (sigma3-sigma1)^2]/sqrt(2) <= Sy — less conservative by 15% but more accurate experimentally. Brittle: Maximum Normal Stress criterion and Mohr-Coulomb criterion for materials with unequal tensile/compressive strength.
What fracture mechanics content is included?
Linear elastic fracture mechanics (LEFM): stress intensity factor K = Y x sigma x sqrt(pi x a), where Y is geometry factor (tabulated in ASTM E399 and BS 7448), sigma is applied stress (MPa), and a is crack half-length (m). Fracture criterion: K less than KIc (plane-strain fracture toughness). For IS 2062 E250 carbon steel: KIc approximately 50-80 MPa-sqrt(m). ASME Section XI uses KIc-based flaw acceptance criteria for pressure vessel in-service inspection.
How do I access this book after purchase?
eBook PDF: Instant download via email and 3D-LABS dashboard. Paper Book: Printed and shipped to India.
What’s Included
An instant PDF download covering the core concepts, practical examples, and key references — ready to read on any device.

